Atomic force microscopy on a chip
نویسندگان
چکیده
منابع مشابه
Atomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملMEMS-Based Nanopositioning for On-Chip Atomic Force Microscopy
An important component of an atomic force microscope is a nanopositioner that moves the sample, relative to the probe, in a raster pattern. A typical AFM nanopositioner is a large, heavy flexure-guided mechanism machined from a solid block of steel or aluminum, with incorporated actuators and displacement sensors. The most widely used actuation technology for nanopositioning is the piezoelectri...
متن کاملAtomic force microscopy on fibers
Natural and synthetic fibers exhibit a huge diversity regarding their dimension, structure and physical-chemical properties. The wanted properties of textiles are adjusted by directed selection, development and processing of fiber material. Atomic force microscopy offers as sole method the possibility to acquire quantitative information in the nanoand micro range under environmental conditions ...
متن کاملatomic force microscopy application in biological research: a review study
atomic force microscopy (afm) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. afm is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. there are several methods and many ways to modify the tip of the afm to investigate surface properties, ...
متن کاملSensitivity Analysis of Frequency Response of Atomic Force Microscopy in Liquid Environment on Cantilever's Geometrical Parameters
In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Analytical Chemistry
سال: 2005
ISSN: 0003-2700,1520-6882
DOI: 10.1021/ac053373x